EPAR: Electromagnetic Pathways to Architectural Reliability in Quantum Processor
Abstract
As superconducting quantum processors scale, understanding how physical layout shapes qubit interactions has become essential for architectural reliability. However, existing approaches offer limited visibility into how layout-dependent electromagnetic behavior translates into quantum execution-level effects. In this paper, we present EPAR, a unified electromagnetic-to-architecture framework revealing how field-driven disturbances manifest as connectivity distortions within realistic superconducting layouts. By unifying electromagnetic modeling with architectural analysis, EPAR uncovers quantitative robustness regimes, showing stable behavior for LTD $< 0.15$ and SI $< 0.10$, pulse-dependent fragility for intermediate distortion, and sharp fidelity collapse beyond LTD $> 0.80$ or SI $> 0.25$. EPAR also demonstrates that edges with identical two-qubit error rates can differ by more than $10\times$ in dynamic robustness.
